The powder diffractometers belonging to the Nanoscale Materials Characterization Facility are housed in the same lab as the Chemistry department's single-crystal diffractometers. Currently, the suite of diffractometers consists of a Panalytical X'pert, a Panalytical Empyrean, a Bruker D2 Phaser and a Rigaku SmartLab. They can operate in para-focusing (Bragg-Brentano) or parallel beam geometry. They can handle powders, bulk samples or thin films. Variable temperature measurements from 25 C to 1200 C are possible. Available X-ray sources are Cu, Mo and Cr. More details about the individual instruments can be found here.